Test access to the IEEE / IET Electronic Library (IEL) database
I invite you to test the IEEE / IET Electronic Library (IEL) database on IEEE publications. Xplore provides literature resources of the Institute of Electrical and Electronics Engineers (IEEE) and the Institution of Engineering and Technology (IET) in nuclear engineering, physics, plasma physics, computer science, electrical engineering, electronics and related sciences
As part of testing the database, access is:
- Unlimited, full-text access to more than 4.5 million documents
- Documents delivered in PDF and HTML (as available) formats
- Approx. 230 magazines, journals, published by IEEE and IET
- Conference proceedings from over 1,700 IEEE and IET annual conferences
- Summaries of IET seminars and conferences: over 25
- IEEE standards: more than 3900 approved and issued by IEEE standards in key technology fields, with the option to add draft standards
The complete Journals:
https: //open. ieee. org/index. php/publishing-options/hybrid-journals/
Full-text access is at: https: //www. ieee. org/ieeexplore
The test provides access to current and archival titles even from 1870 s (for selected titles)
Trial End Date: 10/15/2019
Training tools:
- Quick user guides: www. ieee. org/go/userguides
- Quick self-paced tutorial videos: www. ieee. org/go/trainingmodule
- Live online training: www. ieee. org/go/training
